Jeol Jeol JSM-6390/

Listing description

The JSM-6390LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings.
The Low Vacuum mode, which can be accessed by the click of a mouse, allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. The specimen chamber can accommodate a specimen of up to 6-inches in diameter. Standard automated features include auto focus/auto stigmator, auto gun (saturation, bias and alignment), and automatic contrast and brightness.
The JSM-6390LV is easy to operate and provides user versatility for many research and diagnostic applications.
The scanning electron microscope is sell with the EDX-PV8206/600, GENESIS XM 2 IMAGING SYSTEM 60 FOR SEM.

Product features:
Resolution: 3.0nm (at 30kV and 8mm WD).
Magnification: 5X to 300,000X (163 steps).
Accelerating Voltage: 500V to 30kV.

Used equipment can sell very quickly. Don’t hesitate to contact us to discuss about this Jeol JSM-6460.

This equipment is located in US