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Manual Analytical Wafer Probe Station. Manual prober for failure analysis. 4-inch dia. chuck. Bausch & Lomb MicroZoom microscope with two long working distance objectives. Backlash free stage positioning. 1-inch linear vacuum chuck Z motion. Platen accepts vacuum or magnetic base manipulators.
Inventory Number: 60285.
Please note that the refurbishment process does not begin until the equipment has been purchased. Sold fully checked out and refurbished by one of our technicians with our standard 3 month parts warranty.
This equipment is located in US
| Manufacturer | Alessi |
| Model | REL-3200A |
| Year | - |
| Country |
USA
|
| Condition | Good |
| Main category | PCB and SMT equipment |
| Subcategory | Semiconductor Equipment |
| ID | P60524040 |
| Client type | Machinery dealer |
| On Kitmondo since | 2016 |
| Number of listings | 0 |
| Country |
USA
|
| Last activity | Oct. 6, 2016 |
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