Cascade 12000 P 12000

Listing description

The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements.
• Probe Station: Cascade Summit 12000-series semi-automatic, thermal wafer prober with MicroChamber(TM) and AttoGuard(TM) shielding
• Thermal Wafer Chuck: 8-inch/200mm Temptronic thermal wafer chuck (Ni) with FemtoGuard(TM) shielding
• Thermal Controller: Temptronic TPO3000-2300-1; 115volts/60Hz/1Ph/20Amps
• System Controller: 19-inch rack-mount computer; Windows(TM) 2000 operating system and Nucleus(TM) 2.7 prober control software.
• Microscope: Mitutoyo FS-70 compound microscope with trinocular head, includes 10X eyepieces and (qty 1) Mitutoyo MPlan APO 2X
objective lens.
Additional microscope lenses are sold separately.
• High-Stability Bridge Mount: X-Y travel = 25.4 x 25.4mm (1 x1-inch), Lift repeatability = 1u (0.04mil) typical, Tiltback range = 2 to 3-inch (5.08-7.62cm), Weight supported = 70lb (max.)
• Triaxial & Vacuum Connection Panels: 14x triaxial-to-triaxial connectors, 1x shorting link (Cascade p/n 116-643), vacuum connection panel with 10 vacuum ports (5 right, 5 left)

This equipment is located in US