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KLA-TENCOR SURFSCAN 6220 DEFECT INSPECTION SYSTEM consisting of:
- Model: Surfscan 6220
- Automatic Surface Inspection System
- Bare Wafer Surface Defect Inspection System
- Substrate/Sizes: 2", 3", 4", 6" and 8" Wafer Capable
- Thickness: SEMI Standard Wafer Thickness
- Material: Any Opaque, Polished Surface which Scatters less than 5 percent of Incident Light
- Defect Sensitivity: 0.09 Micrometer Diameter PSL Sphere Equivalent with greater than 80 percent Capture Rate (0.112um @ 90%)
- Repeatability: Count Repeatability Error less than 0.5 percent at 1 Standard Deviation (Mean Count greater than 500, 0.364 mm dia. Latex Spheres).
- Accuracy: Count Accuracy better than 99 percent (verified with VLSI Standards’ Relative Standard)
- Throughput: 100 wph (200 mm) at 0.12 mm
- Contamination: Less than 0.005 Particles/cm2 greater than 0.15 mm dia. per single pass
- Cassette Handling: Single Puck Wafer Handling from two Cassettes (one Sender/Receiver, one Receiver)
- Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
- Operator Interface: Mouse and/or Dedicated User Keypad
- Shipping Weight: 300 kg (670 lbs)
- Operations Manual and Documentation
- Power Supply will fit to the Customer Location
- Guaranteed to be Fully Refurbished to Meet OEM Specifications
This equipment is located in US
Manufacturer | Kla-tencor |
Model | Surfscan 6220 |
Year | - |
Country | USA |
Condition | Good |
Main category | PCB and SMT equipment |
Subcategory | Semiconductor Equipment |
ID | P41029332 |
Client type | Machinery dealer |
On Kitmondo since | 2011 |
Number of listings | 0 |
Country | USA |
Last activity | Aug. 25, 2023 |