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4D Systems 280 P250414120
4D Systems 280 P250414120
4D Systems 280 P250414120
4D Systems 280 P250414120

4D Systems 280 Automatic Four Point Probe Meter

2,200 €

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Manufacturer 4D Systems
Model 280
Year
Location Taiwan TW
Category Semiconductor - Test and measurement equipment
Product id P250414120
Language
bg Автоматичен измервателен уред с четири точки 4D Systems 280
cs Automatický čtyřbodový měřič 4D Systems 280
da 4D Systems 280 Automatisk firepunkts-probemåler
de 4D Systems 280 Automatisches Vierpunkt-Sondenmessgerät
el Αυτόματος μετρητής ανιχνευτή τεσσάρων σημείων 4D Systems 280
en 4D Systems 280 Automatic Four Point Probe Meter
es Medidor automático de cuatro sondas 4D Systems 280
fr Sonde automatique à quatre points 4D Systems 280
hr Automatski mjerač sonde s četiri točke 4D Systems 280
hu 4D Systems 280 Automatikus négypontos szondamérő
it Misuratore automatico a quattro punti di sonda 4D Systems 280
lt 4D Systems 280 Automatinis keturių taškų zondų matuoklis
nl 4D Systems 280 Automatische vierpuntssonde meter
pl Automatyczny miernik z sondą czteropunktową 4D Systems 280
pt Medidor automático de sonda de quatro pontos 4D Systems 280
ro Contor automat cu sondă în patru puncte 4D Systems 280
ru 4D Systems 280 Автоматический четырехточечный измерительный щуп
sr Automatski merač sonde u četiri tačke 4D Systems 280
sv 4D Systems 280 Automatisk fyrapunkts probemätare
tr Otomatik Dört Nokta Prob Ölçer 4D Systems 280

Specifications

Software
-------------------
Worked hours
Hours under power
State as-is, where-is
At local norms yes
Status under power

Description

This unit is a 4D Systems Model 280 Automatic Four Point Probe Meter, designed for measuring sheet resistance of semiconductor wafers.

The system powers on successfully, but we do not have the software or accessories to perform further testing. No technical knowledge or expertise to verify functionality. For this reason, it is being sold as-is, with no guarantee of full functionality or calibration.

Features:
• Compatible with wafer sizes: 100mm, 125mm, 150mm, 200mm
• Suitable for P-type and N-type materials
• Includes all components shown in the photos
• Front panel and buttons appear intact
• No software, accessories, or cables included unless shown

Buyers with knowledge of this model may be able to restore or use it for parts.

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


Client type User – small or medium company
Active since 2025
Offers online 1
Last activity May 8, 2025

Description

This unit is a 4D Systems Model 280 Automatic Four Point Probe Meter, designed for measuring sheet resistance of semiconductor wafers.

The system powers on successfully, but we do not have the software or accessories to perform further testing. No technical knowledge or expertise to verify functionality. For this reason, it is being sold as-is, with no guarantee of full functionality or calibration.

Features:
• Compatible with wafer sizes: 100mm, 125mm, 150mm, 200mm
• Suitable for P-type and N-type materials
• Includes all components shown in the photos
• Front panel and buttons appear intact
• No software, accessories, or cables included unless shown

Buyers with knowledge of this model may be able to restore or use it for parts.

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase

Specifications

Software
-------------------
Worked hours
Hours under power
State as-is, where-is
At local norms yes
Status under power

About this seller

Client type User – small or medium company
Active since 2025
Offers online 1
Last activity May 8, 2025

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4D Systems 280 Automatic Four Point Probe Meter