Wafer & Semi Test Equipment 10

Schlumberger ID OPS2000

Year
1999
Location
Israel Israel

March AP-1000

Year
-
Location
Ireland Ireland

ESI Accuscribe 2600

Year
2011
Location
USA USA

Karl SUSS MA 4

Year
-
Location
USA USA

Temescal VES 2550

Year
-
Location
USA USA

Prometrix SM200E

Year
-
Location
USA USA

Schlumberger ID OPS2000

Year: 1999
Location: Israel Israel
Schlumberger IDS 2000 Model OPS2000 ASSEMBLY 95891000 Laser-probe system for flip-chip design verification and failure analysis. - NEWPORT - LIG...

KLA/TENCOR Candela CS10

Year: -
Location: USA USA
Offers <0.08 micron particle sensitivity on polished silicon wafers Exceptional sensitivity to micro scratches for automatic wafer surface inspect...

March AP-1000

Year: -
Location: Ireland Ireland
March AP-1000 Plasma Cleaner Refurbished Chamber 16 x 16 x 18 2 adjustable shelves 2 MFC’s ENI ACG-6B 13.56 MHz 600w rf power supply Leybold D65B...

ESI Accuscribe 2600

Year: 2011
Location: USA USA
This ESI Accuscribe 2600 w/ Panasonic loader is in excellent condition and appears to be unused, but I am unable to verify. This system comes with ...

Karl SUSS MA 4

Year: -
Location: USA USA
KARL SUSS MA 4 MASK ALIGNER 350 WATT POWER SUPPLY 1 MICRON RESOLUTION ON UP TO 4" WAFERS ...

Temescal VES 2550

Year: -
Location: USA USA
Temescal VES 2550 Electron Beam Evaporator (with warranty) 25"X30" CHAMBER (APPROXIMATELY) Choose 4 pocket or 6 pocket electron beam gun TEMESCAL...

SVG Coat Develo 8836

Year: -
Location: USA USA
SVG DUAL COAT DEVELOP TRACKS SET. Model: 8836 HPO Description: SVG 8826/8836 Series Photoresist Coater and Developer (8800 Series Photoresist Coa...

ADE 6033 Wafer Test

Year: -
Location: USA USA
WAFER TESTER FOR WAFER THICKNESS INCLUDES LARGE ANVIL STYLE TABLE TO HOLD SMALL OR LARGE SUBSTRATES

Nanometrics NANOSPEC 210

Year: -
Location: USA USA
The Nanospec 210 is a wafer tester that has a film thickness measurement system. It has a 100 angstrom resolution. Click here to see a demo of th...

Prometrix SM200E

Year: -
Location: USA USA
FOR MEASURING DIELECTRIC THIN FILMS ON WAFERS UP TO 8 DIAMETER INCLUDES COMPUTER WITH MAPPING