Specifications

-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status visible

Description

Fischerscope X-Ray XDVM-W overlay thickness gauge


Type: XDVM-T7-W

System X-RAY model

Machine according to CE standards

Year of construction 2004

The FISCHERSCOPE® X-RAY XDVM®-W can measure the coating thickness and alloy composition of any metal coating system, including single, binary and ternary alloy coatings, double coatings with or without an alloy layer and triple coatings .

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


fischerscope-x-ray-xdvm-w-p220825039_3.pdf Download
Client type Reseller
Active since 2016
Offers online 15
Last activity Nov. 8, 2024

Description

Fischerscope X-Ray XDVM-W overlay thickness gauge


Type: XDVM-T7-W

System X-RAY model

Machine according to CE standards

Year of construction 2004

The FISCHERSCOPE® X-RAY XDVM®-W can measure the coating thickness and alloy composition of any metal coating system, including single, binary and ternary alloy coatings, double coatings with or without an alloy layer and triple coatings .

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


Specifications

-------------------
Worked hours
Hours under power
State good
At local norms ---------
Status visible

About this seller

Client type Reseller
Active since 2016
Offers online 15
Last activity Nov. 8, 2024

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Fischerscope X-Ray XDVM-W