Manufacturer | Applied Materia |
Model | SEMVISION CX+ |
Year | 1999 |
Country |
![]() |
Condition | Good |
Main category | Test and Measurement |
Subcategory | Optical Test Equipment |
ID | P80628006 |
Used tool, in working order,
currently not in production.
The tool is located in a fab
in Moscow, Russia.
Features:
Wafer size - 200 mm (8")
Module: CFM
Type of chuck: standard
SMIF-Interface, loadports: Asyst - IND2200
Process application: auto, SEM Review
Copper process: NO
EDX
CXplus Upgrade
CE-marked
Currently warehoused
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