Applied Materia SEMVISION CX+

Last availability: unknown - check availability

Listing description

Used tool, in working order,
currently not in production.
The tool is located in a fab
in Moscow, Russia.
Features:
Wafer size - 200 mm (8")
Module: CFM
Type of chuck: standard
SMIF-Interface, loadports: Asyst - IND2200
Process application: auto, SEM Review
Copper process: NO
EDX
CXplus Upgrade
CE-marked
Currently warehoused

Please note that this description may have been translated automatically.

€55,600

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Last availability: unknown - check availability

Listing information

Manufacturer	Applied Materia
Model	SEMVISION CX+
Year	1999
Country	Russia
Condition	Good
Main category	Test and Measurement
Subcategory	Optical Test Equipment
ID	P80628006