Applied Materia SEMVISION CX+

Manufacturer Applied Materia
Model SEMVISION CX+
Year 1999
Country Russia Russia
Condition Good
Main category Test and Measurement
Subcategory Optical Test Equipment
ID P80628006

Used tool, in working order,
currently not in production.
The tool is located in a fab
in Moscow, Russia.
Features:
Wafer size - 200 mm (8")
Module: CFM
Type of chuck: standard
SMIF-Interface, loadports: Asyst - IND2200
Process application: auto, SEM Review
Copper process: NO
EDX
CXplus Upgrade
CE-marked
Currently warehoused

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