Biorad QS-1200

Listing description

Biorad QS-1200 FT-IR Spectrometer
Wafer Size Range
Minimum 100 mm

Maximum 300 mm
Configuration
Date of Mfg: 2004;
Placed into Service June 2005
Non-Destructive Measurement of Epitaxial Silicon Films
Manual Wafer Handling – 12” Nose Cone
Sample Tray (2”, 3”, 4”, 5”, 6”, 8” and 300mm)
Manual Wafer Loading
New KBr Optical Components
FTS-575 Bench
Dynamically Tuned Beam Splitter
Dual Frequency IR Source
HeNe Laser
Dell GX270 3.2 Ghz 1G Ram 320G HD
Networking, USB, Large Harddisk Support
Windows XP OS
Win-IR Pro Rev. 2.51
Win-Epi
Microsoft Access Software
System Software, Epi Measurement Software & Site Preparation Manuals Included

Vintage 2004

This equipment is located in IE