Hitachi S-3000N scanning electron microscope


Last availability: Oct. 7, 2020

Listing description

Hitachi S-3000N scanning electron microscope
Hitachi S-3000N Scanning Electron MicroscopeHitachi S-3000N scanning electron microscope (SEM) is a PC controlled variable pressure SEM with the ability to switch between the high vacuum and variable pressure modes. It has a high density frame memory of 1280x960 pixels and an advanced image capture and archiving system.

Four quadrant solid state backscatter allows imaging in the compositional, 3D and topographic modes by manipulating from each segment of the detector.

System specifications
0.3 - 30kV acceleration voltage range
5 nm resolution at 25kV in variable pressure mode
150mm diameter maximum specimen size
Dual-bias for low voltage signal noise
Backscatter mode


Please note that this description may have been translated automatically.

Last availability: Oct. 7, 2020

Listing information

Manufacturer Hitachi
Model S-3000N
Year 2000
Country South Korea South Korea
Condition Good
Main category PCB and Semiconductor
Subcategory Semiconductor Equipment
ID P01006001

Last availability: Oct. 7, 2020

About the seller

Client type End User
On Kitmondo since 2007
Number of listings 2
Country South Korea South Korea
Employees 1 - 10
Established 2006
Company description

A Dedicated Supplier of Surplus Equipment for IC Assembly & Packaging Technology

Braving Innovation, Pursuing Excellence

Last activity Oct. 15, 2020
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