Hitachi - S-3400N-Type II

Listing description

Manufacturer: Hitachi
Model: S-3400N-Type II
Sources:
Asset Type: Microscope
Year: 2011
Quantity: 1

Extra Information: HITACHI S3400-N Type II Scanning Electron Microscope (SEM), 2011 ?Magnification : x 5 ~x 300,000 Accelerating voltage : 0.3 ~30 kV Variable pressure range : 6 ~270 Pa (Through GUI) Image shift : +/- 50 ~m (at W.D.=10 mm) BSE detector : High Sensitivity Quad+1 BSE type Specimen size : 200 mm dia. Specimen stages : X: 100 mm, Y: 50 mm, Z: 5 ~65 mm                                    T: 0 ~60 degrees, R: 360 degrees 5 Axis Motorized                                    Specimen height 80mm at 10mm W.D. Frame memory : 640x480pixels, 1,280x960pixels,                                 2,560x1,920pixels, 5120x3840pixels  X-ray analysis : Working distance: 10 mm                               X-ray take-off angle: 35 degrees

This equipment is located in KR