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2 Nanometrics Nanospec AFT2100 Film Thickness Measurement System

Nanometrics Nanospec AFT2100 Film Thickness Measurement System

Year
-
Location
USA USA
Price on request
2 Nanometrics Nanospec AFT2100 Film Thickness Measurement System

Nanometrics Nanospec AFT2100 Film Thickness Measurement System

Year: -
Location: USA USA
film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator …
Price on request

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