Sopra Ellipsometer GXR

Last availability: Nov. 4, 2021

Listing description





SOPRA has developed a new approach by combining two non-destructive characterization techniques on the same instrument: Spectroscopic Ellipsometry (SE) and Grazing X-Ray Reflectometry (GXR). GXR is a powerful technique to measure the absolute thickness without an a-priori structural modelling of a multi-layer stack. GXR applies to any type of material: semiconductor, metallic, dielectric, organic. GXR and SE measurement can be performed quasi-simultaneously at exactly the same sample location. Analysis of complementary data from both techniques with the same physical model leads to unprecedented accuracy in measurement results. Grazing X-Ray Reflectometry (GXR) is certainly the technique of choice for absolute thickness measurement of new materials. At this energy, every material displays the same refractive indices (n being 1 and k being 0), simplifying considerably the structural model for data analysis. In case of complex multi-layers, accurate information can be obtained on the periodicity of stacks as well as on the interlayer structures.SE combined GXR is the winning choice for the following applications: High K dielectrics (ZrO2, nitrided oxides), Thin ONO layers, thin optical coatings, Si and SiGe thin epitaxial structures, thin metallic and organic layers, coatings for micro-lithography.

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Last availability: Nov. 4, 2021

Listing information

Manufacturer Sopra
Model GXR
Year -
Country USA USA
Condition Good
Quantity 2
Main category PCB and Semiconductor
Subcategory Semiconductor Equipment
ID P11102016

Last availability: Nov. 4, 2021

About the seller

Client type Machinery dealer
On Kitmondo since 2017
Number of listings 67
Country USA USA
Employees 11 - 50
Established 1989
Last activity Nov. 17, 2021
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