3D Optical profiler nanometer measurement with confocal, interferometry and focus variation technology.
A QA/QC and R&D solution engineered for speed. 3D profiling to the nanometer with 3 optical technologies and the ability to measure smooth and shiny surfaces.
The S Neox measures using confocal, interferometry and focus variation techniques. For the measurement of roughness, surface finish, flatness and waviness on materials such as thin film and wafers.
Ai focus variation – Saves each layer as the lens moves upward allowing you to see shape and curvature.
Confocal – Only allows focused light through allowing you to see the surface structure.
Interferometry – Uses a laser to allow very accurate measurement down to nanometers great for shiny surfaces such as wafers.
Spectroscopic Reflectometry: Perform thickness measurements on transparent layers in a quick, accurate and non-destructive way.
This equipment is located in MY
|Client type||End User|
|On Kitmondo since||2022|
|Number of listings||33|
|Last activity||Oct. 31, 2022|