Leilão on-line – Zeiss Wafer Scanning Electron Microscope

Sealed Bid Offer of a Zeiss Wafer Scanning Electron Microscope

DCG Z-Series nProber SEM with EBC HAS and TCP Upgrades

Featured Items:
- Electrical characterization for device quality or failure analysis
- 8-point, 6-point and 4-point probin
- Bitcell stability testing
- Metal 1-level probing
- Contact-level probing
- Butterfly curves
- Kelvin probing