Description
3D Optical profiler nanometer measurement with confocal, interferometry and focus variation technology
A QA/QC and R&D solution engineered for speed. 3D profiling to the nanometer with 3 optical technologies and the ability to measure smooth and shiny surfaces. The S Neox measures using confocal, interferometry and focus variation techniques. For the measurement of roughness, surface finish, flatness and waviness on materials such as thin film and wafers.
Ai focus variation – Saves each layer as the lens moves upward allowing you to see shape and curvature.
Confocal – Only allows focused light through allowing you to see the surface structure. Interferometry – Uses a laser to allow very accurate measurement down to nanometers great for shiny surfaces such as wafers.
Spectroscopic Reflectometry – Perform thickness measurements on transparent layers in a quick, accurate and non-destructive way.
Accessories Includes:
Joystick & Power Module
Microscope Magnification Lens: Nikon LU Plan Flour 10X, 20X, 50X, 100X
Motorized X-Y Profiler
Vibration Isolation Table
Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase