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MANUFACTURER: KLA TENCOR
MODEL: CANDELA CS2
The Candela CS2 wafer defect detection system simultaneously measures surface reflectivity and topography for automatic defect detection and classification. The automated wafer inspection system's defect detection and inspection technology combines scatterometry, ellipsometry, reflectometry, and topographical analysis to non-destructively inspect wafer surfaces for defects, and film thickness uniformity, of opaque substrates, epi layers, and transparent film coatings
This equipment is located in US
Manufacturer | Kla Tencor |
Model | CANDELA CS2 |
Year | - |
Country | USA |
Condition | Good |
Main category | PCB and SMT equipment |
Subcategory | Semiconductor Equipment |
ID | P70922040 |
Client type | Machinery dealer |
On Kitmondo since | 2017 |
Number of listings | 50 |
Country | USA |
Employees | 11 - 50 |
Established | 1989 |
Last activity | May 30, 2023 |