Metricon 2010/M Prism Coupler

Listing description

Index Accuracy: ±.0005 (worst case). Absolute index accuracy is limited primarily by uncertainties in determining the angle and refractive index of the measuring prism. For samples of reasonable optical quality, if a high resolution table is used and if the user is willing to perform a simple calibration procedure with each prism, absolute index accuracy of ±.0001-.0002 can be achieved. NIST, fused silica, and other standards are available for index calibration.
Index resolution: ±.0003 (worst case). For samples of reasonable optical quality, index resolution can be improved up to ±.00005 by use of a high resolution rotary table, a no-cost option.
Thickness accuracy: ±(0.5% + 5 nm)
Thickness resolution: ±0.3%
Operating wavelength: Optional shorter wavelengths (405, 450, 473, 532, 594 nm) for measurement of thinner films and near-IR (830, 980, 1064, 1310, 1550 nm) wavelengths for fiber/integrated optics applications are available. Optional sources change CDRH safety class to IIIa or IIIb.
Typical measurement time: 10-25 seconds with standard table, 20-75 seconds with high resolution table.
Measurement area: While the film and measuring prism are in contact over an area roughly 8 mm square, film area actually measured is only 1 mm diameter.
Refractive index measuring range: With standard prisms, films and bulk materials with refractive index 2.65 and below are measurable. Specialized prisms are available to permit index measurements up to 3.35 (consult Metricon for details).
Film types/thickness ranges measurable: The Model 2010/M can measure virtually any film type which is not metallic or very highly absorbing at the operating wavelength. In many cases, thickness and index of one or both films of dual film layers are measurable*, provided the top film has higher refractive index. Thickness must exceed a minimum threshold which depends on film and substrate (or underlying film) index.

This equipment is located in US