Nanometrics Nanospec AFT2100 Film Thickness Measurement System

Price on request
Last availability: March 12, 2024

Listing description

film thickness from 100A to 50 microns
Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator
spot size 6.5um to 65um
wavelength range 400-800nm
16 standard films tests
special films can be measured by entering the refractive index
Refurbished by Nanometrics factory trained technicians March 2022

This equipment is located in US


Please note that this description may have been translated automatically.
Price on request
Last availability: March 12, 2024

Listing information

Manufacturer Nanometrics
Model Nanospec AFT2100
Year -
Country USA USA
Condition Good
Main category PCB and SMT equipment
Subcategory Wafer & Semi Test Equipment
ID P40312044
Price on request
Last availability: March 12, 2024

About the seller

Client type Machinery dealer
On Kitmondo since 2019
Number of listings 50
Country USA USA
Last activity March 14, 2024
Contact Click here

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