Online Auction - Zeiss Wafer Scanning Electron Microscope

Auctioneer EquipNet
Closing date Dec. 10, 2019
Location USA USA
Category PCB and Semiconductor
ID TAM0125-3
Status Closed
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Sealed Bid Offer of a Zeiss Wafer Scanning Electron Microscope

DCG Z-Series nProber SEM with EBC HAS and TCP Upgrades

Featured Items:
- Electrical characterization for device quality or failure analysis
- 8-point, 6-point and 4-point probin
- Bitcell stability testing
- Metal 1-level probing
- Contact-level probing
- Butterfly curves
- Kelvin probing

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Please note that this description may have been translated automatically.
Zeiss Wafer Scanning Electron Microscope 1
Zeiss Wafer Scanning Electron Microscope 2
Zeiss Wafer Scanning Electron Microscope 3
Zeiss Wafer Scanning Electron Microscope 4
Zeiss Wafer Scanning Electron Microscope 5
Zeiss Wafer Scanning Electron Microscope 6
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