Auctioneer | EquipNet |
Closing date | Dec. 10, 2019 |
Location |
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Category | PCB and Semiconductor |
ID | TAM0125-3 |
Status | Closed |
Sealed Bid Offer of a Zeiss Wafer Scanning Electron Microscope
DCG Z-Series nProber SEM with EBC HAS and TCP Upgrades
Featured Items:
- Electrical characterization for device quality or failure analysis
- 8-point, 6-point and 4-point probin
- Bitcell stability testing
- Metal 1-level probing
- Contact-level probing
- Butterfly curves
- Kelvin probing