Used Electroglas EG2001x AUTO PROBER+MAPPING CAPABILITY (Lot of 2)

Listing description

Automatic Wafer Prober. Cassette to cassette wafer handling. Auto align. Pattern recognition. Belt track wafer handling. Systems can be configured for wafers 3in to 6in diameter.

The tool is typically employed to automatically load, align, and probe multiple locations on a wafer or series of wafers. It is also possible to utilize the tool manually. In this case wafers or pieces of wafers are individually placed on the chuck and guided by means of a microscope viewer to the probe needles. Electrical tests are then manually initiated by the user.

Wafer probers are commonly employed when it is necessary to acquire large amounts of test data. A typical situation of this type is when statistical analysis is to be performed on the data set or when numerous devices must be screened for product validation. Wafers which are intended to receive automatic testing on a wafer prober must have certain features designed into them. These typically include features (“alignment keys”) which the prober can identify with a vision system to accurately align the wafer and bring it into a precise locational relationship to the probe card. Devices on the wafer targeted for testing must have contact locations (“test pads”) which match needle positions on the probe card, and are sufficiently large to accommodate nominal targeting errors in the prober’s alignment system.

The prober is only one component of the test system, responsible for bringing the DUT (Device Under Test) into contact with a probe card which is in turn connected to a suitable test instrument. Common test instruments include semiconductor parameter analyzers for transistor characterization, multi-meters for resistance or current measurements, capacitance meters, and sometimes custom-built devices.

Once configured and integrated with a test instrument, the probers are capable of running unattended for extended intervals. It is possible to conduct tests of many hours’ duration, or to test hundreds or even thousands of devices, accumulating large quantities of test data in support of research or production goals.

Accessories
1. Isolation Table
2. Joysticks
3. Power Module
4. Display Monitor
5. Cassette Loader.

This equipment is located in MY