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Rudolph Technologies NSX® wafer inspection systems offer high throughput along with repeatable macro wafer defect inspection for defects 0.5 micron and larger.
Macro wafer defects can occur at various phases of semiconductor manufacturing, and can have a major impact on the quality of your microelectronic devices. This cost-effective used Rudolph Technologies NSX 105 wafer inspection system quickly and accurately detects critical defects and provides quality assurance in addition to valuable process information.
The NSX 105 wafer inspection system is field proven across a wide range of applications including semiconductor, wafer bumping, MEMS, optoelectronics, micro displays and data storage.
Key features of this fully refurbished wafer inspection system:
Wafer probe process analysis
Automated macro defect inspection
Quick, reliable 2D bump inspection
Advanced process control and reporting
Fast, flexible refurbished UltraPort-5 automated wafer inspection handling system that handles 150mm through 300mm whole wafers and wafers on film frames
This equipment is located in CH
Manufacturer | Rudolph Technologies |
Model | NSX 105 |
Year | - |
Country | Switzerland |
Condition | Refurbished |
Main category | PCB and SMT equipment |
Subcategory | Wafer & Semi Test Equipment |
ID | P30907041 |
Client type | Machinery dealer |
On Kitmondo since | 2019 |
Number of listings | 17 |
Country | Switzerland |
Last activity | March 12, 2024 |
Contact | Click here |