Test and Measurement 133

Agilent / HP 8648C

Year
-
Location
USA USA

BK Precision 2120B

Year
-
Location
USA USA

TOPCON PP-70 Type

Year
-
Location
Taiwan Taiwan

Honeywell HERMETIC UTI ME

Year
-
Location
Bangladesh Bangladesh

Protek A333 Network Analyzer

Year
-
Location
South Korea South Korea

Anritsu MS8609A (Opt. 0

Year
-
Location
South Korea South Korea

Accent Bio-Rad Q8

Year
-
Location
USA USA

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Brown and Sharp MVAL 343

Year: 1996
Location: UK UK
Brown and Sharpe CMM measurement machine Model Number MVAL 343, in good working order, including PC and software System PCJ-DMIS 2001.

EMI ESS Program 150-100-2-D

Year: -
Location: USA USA
Unit is perfect working order 150 V 100 Amp 190-250 vac in Digital Panel Meter

HP/Agilent 8703A Lightwave Component Analyzer

Year: -
Location: South Korea South Korea
HP/Agilent 8703A Lightwave Component Analyzer Description The HP/Agilent 8703A measures each of the system elements that transmit these wide ba...

Agilent / HP 8648C

Year: -
Location: USA USA
Signal Generator 9KHz to 3200MHz Stable RF generator for testing to 3200MHz

BK Precision 2120B

Year: -
Location: USA USA
Analog Oscilloscope

NEW FLUKE 9144 FLUKE 9144, 50C

Year: -
Location: India India
NEW AND UNUSED FLUKE 9144 High Temperature Field Metrology Well, 50C to 650C

TOPCON PP-70 Type

Year: -
Location: Taiwan Taiwan
TOPCON(JAPAN) Optical Profile Projector PP-70 TYPE Screen size:660×500?Object lens:10X?20X?Measuring stage 180×160?Body 865×1087×1820

Honeywell HERMETIC UTI ME

Year: -
Location: Bangladesh Bangladesh
Dear Sir & Madam, Happy New Year! We have available ????- ?-?HERMETIC UTI METER ?GTEX ?-BLUE TYPE? & -??HERMETIC UTI METER ??R?TEX? ?for sale. ...

KLA-Tencor Surfscan 6200

Year: -
Location: USA USA
KLA-TENCOR SURFSCAN 6200 SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: 6200 Surfscan - Bare Wafer Surface Defect Inspection System -...

Protek A333 Network Analyzer

Year: -
Location: South Korea South Korea
Description The Protek A333 network analyzer has been developed and produced for higher frequency resolution and more convenient user interfaces t...

Anritsu MS8609A (Opt. 0

Year: -
Location: South Korea South Korea
Key Features & Specifications MS8608A and MS8609A are transmitter testers equipped with an internal spectrum analyzer, a modulation analyzer and a...

KLA-Tencor UV-1050

Year: -
Location: USA USA
KLA-TENCOR UV-1050 THIN FILM MEASUREMENT SYSTEM consisting of: - Model: Prometrix UV-1050 - Thin Film Measurement Tool - Broadband UV Optics - ...

KLA-Tencor Surfscan 6400

Year: -
Location: USA USA
KLA-TENCOR SURFSCAN 6400 SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: Surfscan 6400 - Bare Wafer Surface Defect Inspection System - Sy...

KLA-Tencor Surfscan 6420

Year: -
Location: USA USA
KLA-TENCOR SURFSCAN 6420 DEFECT INSPECTION SYSTEM consisting of: - Model: Surfscan 6420 - Bare Wafer Surface Defect Inspection System Substrate ...

Accent Bio-Rad Q8

Year: -
Location: USA USA
ACCENT BIO-RAD Q8 REGISTRATION TOOL consisting of: - Model: Q8 - Control Unit - Fully Robotic with Random Access, Pick and Place - Wafer Stage...

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KLA-Tencor Surfscan 6100

Year: -
Location: USA USA
KLA-TENCOR SURFSCAN 6100 SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: 6100 Surfscan - Bare Wafer Surface Defect Inspection System -...

Sopra GES-5 Ellipsome

Year: -
Location: USA USA
SOPRA GES-5 ELLIPSOMETER consisting of: - Model: GES-5 - Spectroscopic Ellipsometer - 12 Vacuum Chuck - Allows for Variable-Angle Broadband Spect...

KLA-Tencor SP1 TBI

Year: -
Location: USA USA
KLA-TENCOR SP1 TBI UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 TBI - Puck/Vacuum Handling - Unpatterned Surface Inspection S...

Nanometrics Nanospec 8300

Year: -
Location: USA USA
NANOMETRICS NANOSPEC 8300 FILM THICKNESS MEASUREMENT SYSTEM consisting of: - Model: Nanospec 8300 - Wafer Size: 200mm and 300mm wafers - Automati...

HP/Agilent 3458A/01/02

Year: -
Location: USA USA
8 1/2 Digital Multimeter Measurement Capability 8-ppm 1 year dcV accuracy, optional 4-ppm 0.05 ppm dcV transfer accuracy Superior AC voltage m...

KLA-Tencor Surfscan 6220

Year: -
Location: USA USA
KLA-TENCOR SURFSCAN 6220 DEFECT INSPECTION SYSTEM consisting of: - Model: Surfscan 6220 - Automatic Surface Inspection System - Bare Wafer Surfa...