Categories
Start selling

Account

Log In
Create an account
Log In
Create an account
Metricon 2010/M P240314068
Metricon 2010/M P240314068
Metricon 2010/M P240314068
Metricon 2010/M P240314068

Metricon 2010/M Prism Coupler Verified seller

Price on request

Make an offer
Manufacturer Metricon
Model 2010/M
Year 2018
Location USA US
Category Semiconductors - Metrology equipment
Product id P240314068
Language
bg Профилен проектор Metricon 2010/M
cs Projektor na kontrolu profilu Metricon 2010/M
da Metricon 2010/M Profilprojektor
de Metricon 2010/M Profilprojektor
el Προβολέας προφίλ Metricon 2010/M
en Metricon 2010/M Prism Coupler
es Proyector de perfil Metricon 2010/M
fr Projecteur de profil Metricon 2010/M
hr Projektor profila Metricon 2010/M
hu Metricon 2010/M Profil projektor
it Proiettor profili Metricon 2010/M
lt Profilinis projektorius Metricon 2010/M
nl Metricon 2010/M Profielprojector
pl Profile projector Metricon 2010/M
pt Projetor de perfil Metricon 2010/M
ro Proiector de profil Metricon 2010/M
ru Metricon 2010/M Проектор профил
sr Profil projektor Metricon 2010/M
sv Metricon 2010/M Profilprojektor
tr Profil projektörü Metricon 2010/M

Specifications

Software
-------------------
worked hours
hours under power
state good
At local norms ---------
status
Last availability date 13/10/2025

Description

Model 2010/M Specifications

Index Accuracy: ±0.0005 (worst case), limited mainly by uncertainties in prism angle and refractive index. With a high-resolution rotary table and simple calibration per prism, accuracy improves to ±0.0001–0.0002. Calibration standards (e.g., NIST, fused silica) are available.

Index Resolution: ±0.0003 (worst case). Improves to ±0.00005 using a high-resolution table (no-cost option).

Thickness Accuracy: ±(0.5% + 5 nm)

Thickness Resolution: ±0.3%

Refractive Index Measuring Range: Up to 2.65 with standard prisms. Specialized prisms available for materials up to 3.35 (consult Metricon).

Film Types & Thickness Ranges Measurable: Can measure virtually any film that is not metallic or highly absorbing at the operating wavelength. Dual-layer films measurable if the top film has higher refractive index. Minimum measurable thickness depends on the film/substrate index.

Measurement Area: Contact area ~8 mm²; actual measurement area ~1 mm diameter.

Typical Measurement Time:

10–25 seconds with standard table

20–75 seconds with high-resolution table

Operating Wavelengths:

Standard: 633 nm

Optional visible: 405, 450, 473, 532, 594 nm (for thinner films)

Optional near-IR: 830, 980, 1064, 1310, 1550 nm (for fiber/integrated optics)

Note: Optional sources increase CDRH laser safety class to IIIa or IIIb

Laser Diodes Installed: 405 nm, 521 nm, 636 nm

Prism Code: 999.5

Computer: Dell PC with Windows 7

Manufacture Date: 10-2018

Serial Number: 23033

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase


Client type Reseller
Active since 2019
Offers online 65
Last activity Dec. 5, 2025

Description

Model 2010/M Specifications

Index Accuracy: ±0.0005 (worst case), limited mainly by uncertainties in prism angle and refractive index. With a high-resolution rotary table and simple calibration per prism, accuracy improves to ±0.0001–0.0002. Calibration standards (e.g., NIST, fused silica) are available.

Index Resolution: ±0.0003 (worst case). Improves to ±0.00005 using a high-resolution table (no-cost option).

Thickness Accuracy: ±(0.5% + 5 nm)

Thickness Resolution: ±0.3%

Refractive Index Measuring Range: Up to 2.65 with standard prisms. Specialized prisms available for materials up to 3.35 (consult Metricon).

Film Types & Thickness Ranges Measurable: Can measure virtually any film that is not metallic or highly absorbing at the operating wavelength. Dual-layer films measurable if the top film has higher refractive index. Minimum measurable thickness depends on the film/substrate index.

Measurement Area: Contact area ~8 mm²; actual measurement area ~1 mm diameter.

Typical Measurement Time:

10–25 seconds with standard table

20–75 seconds with high-resolution table

Operating Wavelengths:

Standard: 633 nm

Optional visible: 405, 450, 473, 532, 594 nm (for thinner films)

Optional near-IR: 830, 980, 1064, 1310, 1550 nm (for fiber/integrated optics)

Note: Optional sources increase CDRH laser safety class to IIIa or IIIb

Laser Diodes Installed: 405 nm, 521 nm, 636 nm

Prism Code: 999.5

Computer: Dell PC with Windows 7

Manufacture Date: 10-2018

Serial Number: 23033

Please note that this description may have been translated automatically. Contact us for further information. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase

Specifications

Software
-------------------
worked hours
hours under power
state good
At local norms ---------
status
Last availability date 13/10/2025

About this seller

Client type Reseller
Active since 2019
Offers online 65
Last activity Dec. 5, 2025

Here is a selection of similar machines

Metricon 2010/M Prism Coupler